Background Variation due to Composition Variation in EELS and EFTEM
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

 

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The background due to zero and other energy loss may vary across the specimen due to local changes in composition and thickness.

 

 

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