Background Variation in a Single Measurement in EELS and EFTEM
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/



 

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

 

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These characteristic ionization edges in EELS are superimposed on a background due to zero and other energy losses. The separation of energy loss signal from the background is necessary for extracting elemental information for elemental quantification and mapping. Due to the complexity of process contributing to the background, it is not possible to model the background from first principles. The method usually performed to calculate the background is to estimate the background contribution under the edge from the pre-edge area. The background can first be estimated and subsequently extrapolated to higher energies to subtract it from the core-loss region. However, the background may vary across the specimen due to changes in composition and thickness.

 

 

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