Σ(Sigma Number): Coincident-Site-Lattice (CSL) of Twin and Grain Boundaries
- Practical Electron Microscopy and Database -
- An Online Book -

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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

 

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The Coincident Site Lattice (CSL)is a useful concept for identifying boundaries with low misfit as well as low energy. For instance, two FCC lattices rotate about [110] by an angle θ and allow to interpenetrate through each other to form a dichromatic boundary. At some angles θ, the pattern contains sites shared by both lattices. At such angles, the coincident sites themselves form a lattice, named as CSL, which for the [110] axis is base-centered orthorhombic. The CSL is characterized by the number of sites, Σ (sigma number), of each lattice per coincident site.

 

 

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