Σ(Sigma Number): Coincident-Site-Lattice (CSL) of Twin and Grain Boundaries
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/



 

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

 

=================================================================================

The Coincident Site Lattice (CSL)is a useful concept for identifying boundaries with low misfit as well as low energy. For instance, two FCC lattices rotate about [110] by an angle θ and allow to interpenetrate through each other to form a dichromatic boundary. At some angles θ, the pattern contains sites shared by both lattices. At such angles, the coincident sites themselves form a lattice, named as CSL, which for the [110] axis is base-centered orthorhombic. The CSL is characterized by the number of sites, Σ (sigma number), of each lattice per coincident site.

 

 

=================================================================================

The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.