This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

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Grain boundaries tend to be normal to the film surface. These grain boundaries can be in the form of either amorphous or polycrystalline phases. It is called interfacial reconstruction if the grain boundaries have different crystalline structures from the grains in the materials, such as BCC structure at grain boundaries in FCC materials.

In metals that have low stacking fault energy (SFE), an interfacial reconstruction can occur by the emission of dense arrays of stacking faults that extend from the grain boundaries. [1]