Surface Reconstruction
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, managers, and researchers. The sections and pages with one red star (*) or no star are for basic studies, those with two red stars (**) are at medium level; and those with three red stars (***) are for advanced studies, researchers, and professors. When you are citing the contents in the book, please cite in the format of “Practical Electron Microscopy and Database, Y. Liao, (this year, e.g. 2006)  pp 4832” e.g. if you cite from http://www.globalsino.com/EM/4832.html, or in the format of “Practical Electron Microscopy and Database, Y. Liao, (this year, e.g. 2006),  http://www.globalsino.com/EM/4832.html”).

 

=================================================================================

It is well-know that one of the differences of atomic structure between surface and bulk is surface reconstruction, for instance, the 7 × 7 reconstruction of the Si {111} surface [1]. Researchers have studied surface reconstruction and its dependence on crystallographic and thermodynamic variables, and the phenomenon is now well-established for many types of solids.

 

[1] K. Takayanagi, Y. Tanishiro, S. Takahashi, and M. Takahashi, Surf. Sci. 164, 367 (1985).

 

 

=================================================================================

The book editor and authors welcome your comments, suggestions, corrections, and papers, please click here for submission. Unless it is specified on the page, the author of the current page is Dr. Liao.



 
 
 
Copyright (C) 2006 GlobalSino, All Rights Reserved