Contrast Dependence on Negative Potential on the Sample
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/



 

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

 

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In SEM observations, if the sample is biased with a negative potential V0 it can be assured that all secondary electrons (SEs) within the region of interest are emitted.

 

 

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