This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, managers, and researchers. The sections and pages with one red star (*) or no star are for basic studies, those with two red stars (**) are at medium level; and those with three red stars (***) are for advanced studies, researchers, and professors. When you are citing the contents in the book, please cite in the format of “Practical Electron Microscopy and Database, Y. Liao, (this year, e.g. 2006)  pp 4832” e.g. if you cite from https://www.globalsino.com/EM/4832.html, or in the format of “Practical Electron Microscopy and Database, Y. Liao, (this year, e.g. 2006),  https://www.globalsino.com/EM/4832.html”).

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Although secondary electrons (SEs) have advanced application in many cases, including in SEM techniques, in some devices SE emission is a “harmful” effect, for instance, in the cases of the dynatron effect in electron tubes and the appearance of electric charge on the surface of glass and dielectrics in electrical vacuum devices.