This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, managers, and researchers. The sections and pages with one red star (*) or no star are for basic studies, those with two red stars (**) are at medium level; and those with three red stars (***) are for advanced studies, researchers, and professors. When you are citing the contents in the book, please cite in the format of “Practical Electron Microscopy and Database, Y. Liao, (this year, e.g. 2006)  pp 4832” e.g. if you cite from https://www.globalsino.com/EM/4832.html, or in the format of “Practical Electron Microscopy and Database, Y. Liao, (this year, e.g. 2006),  https://www.globalsino.com/EM/4832.html”).

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Other than the application of secondary electrons (SEs) in electron microscopies, SE  emission is also used in many electrical vacuum devices for amplifying electron currents (photoelectric multipliers, image amplifiers, and so on) and for recording information in the form of potential relief on the surface of the dielectric (electron-beam instruments).