This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

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As we know, the surface topography of a specimen changes the SEM (secondary electron microscopy) contrast. Especially, the contrast at peaks of the topography is enhanced by the efficient electron emission from the peaks. Therefore, in order to enhance contrast of nanoparticles in SEM, we can disperse nanoparticles on a flat surface instead of burying in bulk materials.