Nanoparticles SEM Sample Preparation
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

 

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As we know, the surface topography of a specimen changes the SEM (secondary electron microscopy) contrast. Especially, the contrast at peaks of the topography is enhanced by the efficient electron emission from the peaks. Therefore, in order to enhance contrast of nanoparticles in SEM, we can disperse nanoparticles on a flat surface instead of burying in bulk materials.

 

 

 

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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. You can click How to Cite This Book to cite this book. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.



 
 
 
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