SEM Contrast Dependence on Dopants in Semiconductors
- Practical Electron Microscopy and Database -
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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

 

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Researchers have investigated doping contrast generated by secondary electrons on semiconductor materials. They observed that p-doped regions of a p–n junction appear brighter than n-doped regions [1–21].

 

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