This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

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In a variable pressure, gaseous environment, and low vacuum electron microscopes (SEM and TEM), the beam distortions can be reduced or eliminated by introducing a gas into the specimen chamber [1–4].

[1] V.N.E. Robinson, J. Phys. E 8 (1975) 638.
[2] L.B. Harris, D.A. Moncrieff, V.N.E. Robinson, Phys. Status Solidi A 35 (1976) 371.
[3] A.N. Farley, J.S. Shah, J. Microsc. 164 (1991) 107.
[4] G.D. Danilatos, Adv. Electron. Electron Phys. 71 (1988) 109.