Troubleshooting of EELS/GIF Measurement on Thin TEM/STEM Specimen
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/



 

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

 

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The spectrometer background originates mainly from backscattering of the zero-loss beam from a beam-trap aperture located in front of the detector, resulting in most noticeable with very thin TEM/STEM specimens.

 

 

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