Troubleshooting of EELS/GIF Measurement on Thin TEM/STEM Specimen
- Practical Electron Microscopy and Database -
- An Online Book -

https://www.globalsino.com/EM/



 

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

 

=================================================================================

The spectrometer background originates mainly from backscattering of the zero-loss beam from a beam-trap aperture located in front of the detector, resulting in most noticeable with very thin TEM/STEM specimens.

 

 

=================================================================================

The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.