Electrons Passing through Magnetic Lens
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/



 

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

 

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The electron columns in electron microscopes (EMs) consist of an electron gun and some electromagnetic lenses. Electrons can be focused either by electrostatic or magnetic field. However, all the three components, including illumination system, objective lens/stage, and the imaging system, are normally using electromagnetic lens rather than electrostatic lens. The lenses are the key components in EMs, which allow us to utilize the electron beam in either forming images or focusing the beam in a spot. The function of the lenses is to transform a point in an object to a point in an image and to focus rays to a point in the focal plane of the lens.

 

 

 

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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.