Objective lens versus EDS and EELS
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

 

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With the objective aperture inserted, EDS (Energy-Dispersive X-ray Spectroscopy) measurement cannot be done, so simultaneous EELS (Electron Energy Loss Spectroscopy) and EDS is not possible in this TEM imaging mode.

 

 

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