Electron microscopy
 
Gain Normalization for EELS Measurement
- Practical Electron Microscopy and Database -
- An Online Book -
Microanalysis | EM Book                                                                                   http://www.globalsino.com/EM/        

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
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The channel to channel gain variation in EELS measurements can be minimized by normalizing the experimental spectrum with independently obtained gain spectrum of the spectrometer. On the other hand, in modern GIF system, this normalization is done in EFTEM mode.

 

 

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