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Gain Normalization for EELS Measurement - Practical Electron Microscopy and Database - - An Online Book - |
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| Microanalysis | EM Book https://www.globalsino.com/EM/ | ||||||||
| This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers. | ||||||||
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The channel to channel gain variation in EELS measurements can be minimized by normalizing the experimental spectrum with independently obtained gain spectrum of the spectrometer. On the other hand, in modern GIF system, this normalization is done in EFTEM mode.
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| The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page. | ||||||||
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