Top-entry & Side-entry Lenses in TEM Systems
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

 

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TEM specimen is immersed in the magnetic field. This can be done by using a long specimen rod that is inserted either into the pole piece gap (side-entry lens) or from the top of the lens (top-entry lens). The former is the most common method and especially offers more flexibility for in situ experiments (heating, cooling, straining, etc.), while the latter is less affected by external influences such as variation of room temperature, air pressure, and noise.

Figure 4947 shows the schematic illustration of top-entry specimen stage together with the top-entry lens.

top-entry specimen stage together with the top-entry lens
Figure 4947. Schematic illustration of top-entry specimen stage together with the top-entry lens.

 

 

 

 

 

 

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