Electron microscopy
 
Atomic Number
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Atomic number is essentially a characteristic of an atom and has a value that is unique to each chemical element. Table 948 lists the atomic number of the elements in the periodic table.

Table 948. Atomic number of the elements in the periodic table.
1 2   3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18
1   2
H   He
3 4   5 6 7 8 9 10
Li Be   B C N O F Ne
11 12   13 14 15 16 17 18
Na Mg   Al Si P S Cl Ar
19 20   21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36
K Ca   Sc Ti V Cr Mn Fe Co Ni Cu Zn Ga Ge As Se Br Kr
37 38   39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54
Rb Sr   Y Zr Nb Mo Tc Ru Rh Pd Ag Cd In Sn Sb Te I Xe
55 56   71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86
Cs Ba {57-70} Lu Hf Ta W Re Os Ir Pt Au Hg Tl Pb Bi Po At Rn
87 88 103 104 105 106 107 108 109 110 111 112 114
Fr Ra [89-102] Lr Rf Db Sg Bh Hs Mt Ds Uuu Uub   Uuq
 
57 58 59 60 61 62 63 64 65 66 67 68 69 70    
{lanthanides} {57-70} La Ce Pr Nd Pm Sm Eu Gd Tb Dy Ho Er Th Yb    
89 90 91 92 93 94 95 96 97 98 99 100 101 102
{actinides} [89-102] Ac Th Pa U Np Pu Am Cm Bk Cf Es Fm Md No    
 

Many materials are not a single chemical element, but a conglomerate of compounds and mixtures. For a compound, effective atomic number (Zeff) can be obtained by different methods of calculations. [1]

Case A. EELS measurement

An appropriate model needs to be used for a different purpose, especially for a compound. In EELS analysis, a model based on Lenz model is applied. In this model, the atomic number can be approximated using an effective atomic number Zeff, [2, 4]
          based on Lenz model, the atomic number can be approximated using an effective atomic number Zeff, --------------------------------------- [948a]
where,
          fi -- the atomic fraction of each element of atomic number Zi.

Equation 948a can be computed with a DM script. Note that for approximate EELS calculations, an estimate of the 'mean' Z of the region under investigation can often suffice.

Case B. ADF STEM measurement

For ADF STEM, its intensity, I, can be given by,
          based on Lenz model, the atomic number can be approximated using an effective atomic number Zeff, --------------------------------------- [948b]
where,
          ε = 1.7, 1.8, 1.9 and 2 (Rutherford)
The effective atomic number Zeff here is given by the ADF intensity which is proportional to, [6]
          based on Lenz model, the atomic number can be approximated using an effective atomic number Zeff, --------------------------------------- [948c]
where,
          fi -- the atomic fraction of each element of atomic number Zi.

Case C. Three γ-ray processe

The three γ-ray processes for a single element,, namely photoelectric, Compton and pair production, can be given as a function of photon energy hν and the effective atomic number Zeff of the elements. [5] The interaction is proportional to Zn where n is different for the three processes. Based on Mayneord formula, this effective atomic number Zeff can be given by, [3]
         based on Lenz model, the atomic number can be approximated using an effective atomic number Zeff, --------------------------------------- [948d]
where,
          ai -- the fractional contributions of each (ith) element to the total number of electrons in the mixture.

The exponent, 2.94, in Equation [948d is derived from the relationship between x-ray interactions and atomic number.

Equation 948d can be computed with a DM script.

 

 

 

 

 

 

[1] Z. Kaliman, N. Orlic and I. Jelovica, Calculations of effective atomic number, Nuclear Instruments and Methods in Physics Research A, 580, (2007) 40–42.
[2] Egerton R.F., Electron Energy Loss Spectroscopy in the Electron Microscope (NewYork, Plenum Press, 1986).
[3] F. M. Khan, The Physics of Radiation Therapy (Philadelphia, PA: Lippincott Williams & Wilkins), (2010).
[4] T. Malis, S.C. Cheng, and R.F. Egerton, 'EELS log-ratio technique for specimen thickness measurement in theTEM', J. Electron Microscope Technique, 8 (1988) 193.
[5] R. Murty, Effective Atomic Numbers of Heterogeneous Materials. Nature 207, 398–399 (1965).
[6] T. Walther, Blackwell Publishing Ltd A new experimental procedure to quantify annular dark field images in scanning transmission electron microscopy, Journal of Microscopy, Vol. 221, Pt 2, 137–144 (2006).

 

 

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