Practical Electron Microscopy and Database

An Online Book, Second Edition by Dr. Yougui Liao (2006)

Practical Electron Microscopy and Database - An Online Book

Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix

Shape of Energy-Loss Spectrum

It is well known that the shape of energy-loss spectra changes with specimen thickness due to plural inelastic scattering. Figure 957 shows carbon (C) EELS for t/λ varying from 0.05 to 1.45, calculated from the single scattering distribution based on Poisson Distribution. It clearly shows that the background increases nonlinearly as a function of t/λ corresponding to the multiple scattering terms. On the other hand, as t/λ increases, the shape of the spectrum changes due to the multiple scattering.

Carbon (C) EELS for t/λ varying from 0.05 to 1.45, calculated from the single scattering

Figure 957. Carbon (C) EELS for t/λ varying from 0.05 to 1.45, calculated from the single scattering distribution. Inset with expanded intensity scale, shows spectra in the region of the phosphorus (C) L3,2 edge and the C K edge. [1]

 

 

 

 

 

 

 

 

 

[1] M. A. Aronova, Y. C. Kim, G. Zhang, and R. D. Leapman, Quantification and Thickness Correction of EFTEM Phosphorus Maps, Ultramicroscopy. 2007 ; 107(2-3): 232–244.