Practical Electron Microscopy and Database

Conductive Atomic Force Microscopy (C-AFM) is a specialized mode of Atomic Force Microscopy (AFM) that measures the local electrical properties of a sample while simultaneously mapping its topography. C-AFM uses a conductive probe (usually metal-coated) to scan the surface of a material, allowing for high-resolution measurements of both current flow and surface features.

In C-AFM, a voltage is applied between the conductive tip and the sample, and the resulting current is measured at each point as the tip scans the surface. This technique provides detailed insight into the electrical conductivity, resistivity, and charge transport mechanisms at the nanoscale. C-AFM is commonly used in various fields, including semiconductor research, nanotechnology, and materials science.

Some key applications of C-AFM technique are: 

• Semiconductor materials: Analyzing defects, grain boundaries, and dopant distributions.
• Nanomaterials: Investigating the electrical properties of nanowires, thin films, and 2D materials.
• Organic electronics: Examining the charge transport in organic photovoltaic materials or transistors.