TEM Imaging of Stacking Faults
- Practical Electron Microscopy and Database -
- An Online Book -


This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.


In kinematic approximation, by introducing a phase shift (α) at a stacking fault, the TEM imaging intensity (|Ag|2) is given by,

       TEM Imaging of Stacking Faults -------------------- [1996a]
          α -- (= 2πg·R) The phase shift at the stacking fault;
          R -- The displacement of the crystal below the stacking fault relative to that above it;
          s -- The deviation parameter;
          z -- The stacking fault depth.

Equation 1996a indicates that the visibility of the stacking fault is dependent on α, s, and z.




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