Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix
As shown in Figure 2557, in off-axis electron holography, the two parts of the electron beam originate equivalently from two sources, S1 and S2, induced by the biprism, as in the standard Young’s experiment. Figure 2557. Schematic diagram of off-axis electron holography in TEMs.
The interference width in the hologram, W, can be given by [1], where, On the other hand, the width can also be given by, [2] Practically, the width W of the hologram is limited by the coherent current of the electron beam and by the strength of excitation of the subsequent intermediate lens. [2]
[1] Missiroli, G.F., Pozzi, G., Valdre, U., 1981. Electron interferometry and
interference electron microscopy. J. Phys. E 14, 649–671.
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