Chapter/Index: Introduction | A |
B |
C |
D |
E |
F |
G |
H |
I |
J |
K |
L |
M |
N |
O |
P |
Q |
R |
S |
T |
U |
V |
W |
X |
Y |
Z |
Appendix
Electron Scattering within TEM Specimen
| Multiple scattering normally does not occur within a thin TEM specimen but is significant within a thick SEM specimen where the primary electrons lose most or all of their energy. Table 4103a lists the very common and important classification, sorted by elastic and inelastic scattering.
| Table 4103a. Electron scattering from a specimen in TEM measurements (Incoherent does not imply inelastic scattering; however, inelastic scattering is necessarily incoherent in EM measurements). |
Scattering type |
Energy loss |
Wave (phase) property |
Scattering direction |
Scattering angle |
Electron property |
Full name |
| Elastic |
No energy change of the wave after scattering |
Usually coherent (when the specimen
is thin and crystalline) |
Forward
scattering |
1° ~ 10° |
Wave |
Coherent elastic scattering |
| Incoherent |
> 10° |
Particle |
Incoherent elastic scattering |
| Back scattering |
|
| Inelastic |
There is energy change of the wave after scattering |
Almost always incoherent |
Forward
scattering |
< 1° |
Incoherent inelastic scattering |
| Coherent |
Does not exist in EM measurement, but it shows in neutron scattering |
|
|
Coherent inelastic scattering |
* Incoherence does not
imply inelastic scattering, while inelastic electron scattering is incoherent in electron microscopy.
** Inelastic scattering is not necessarily
incoherent in neutron scattering. |
| Table 4103b. Thickness dependence of electron scattering from a specimen in EM (electron microscope) measurements. |
Scattering direction |
EM method |
Scattering event/angle |
Scattering direction |
Electrons |
Wave (phase) property |
Electron property |
Contrast interpretation |
| Thin specimen |
TEM |
Less scattering events and then smaller scattering angle
|
Forward
scattering |
More electrons |
Strong coherent signal |
Strong wave property |
Easy |
|
Back scattering |
Fewer electrons |
Weak incoherent signal |
Weak particle property |
|
| Thick specimen |
TEM/SEM |
|
Forward
scattering |
Fewer electrons |
Weak coherent signal |
Weak wave property |
Middle |
| Electron is scattered more than once (plural scattering), and then scattering angle is greater |
Back scattering |
More electrons |
Strong incoherent signal |
Strong particle property |
|
| Very thick or bulk specimen |
SEM |
More scattering events and then greater scattering angle |
Forward
scattering |
Fewest electrons |
Weakest coherent signal |
Weakest wave property |
Difficult |
| Electron is scattered >20 times
(multiple scattering), and then scattering angle is greatest |
Back scattering |
Most electrons |
Strongest incoherent signal |
Strongest particle property |
|
Figure 4103 shows the coherence of various scattered electron rays from TEM and SEM specimens.
| Figure 4103. Coherence of various scattered electron rays: (a) Thin film specimen in TEM and/or STEM modes, and (b) Bulk specimen in SEM mode. The electron rays in red are incoherent, while the rays in green are coherent. |
|