Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix
In general, magnetic hysteresis can affect the stability of the magnetic fields. Therefore, hysteresis removal, also known as lens cleaning, should be addressed during optimization of microscope conditions. In SEM systems, the function of DeGauss is used to reduce hysteresis of the magnetic field in the objective lens. Therefore, this function needs to be performed manually or automatically: In TEM systems, hysteresis factor affects the TEM operations under changed lens conditions once magnetized lenses retain a certain amount of residual magnetism. This means that the level of current used does not always specify lens strength. This effect can particularly affect: i) and iii) can be corrected by pressing the STANDARD FOCUS bottom a number of times during the operation. In this way, the applied current is essentially returned to zero a number of times. This reduces lenses to the standard level of magnetization.
Compensation of magnetic hysteresis in condenser lens systems can be performed by:
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