Chapter/Index: Introduction | A |
B |
C |
D |
E |
F |
G |
H |
I |
J |
K |
L |
M |
N |
O |
P |
Q |
R |
S |
T |
U |
V |
W |
X |
Y |
Z |
Appendix
TEM Imaging of Dysprosium Silicides
| Table 979. TEM imaging of dysprosium silicides.
| Dysprosium silicides |
TEM images |
| DySi2-x |
![Stacking faults viewed along (a) [0001] and (b) [-12-10] directions of DySi2-x](image2/978a.PNG)
Stacking faults viewed along (a) [0001] and (b) [-12-10] directions of DySi2-x. [1] |
[1] G.H. Shen, J.C. Chen, L.J. Chen, Planar defects in epitaxial DySi2-x thin films on (111)Si, Applied Surface Science, 142, (1999), 332–335.
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