Electron microscopy
  
TEM Imaging of Dysprosium Silicides
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Table 979. TEM imaging of dysprosium silicides.

Dysprosium silicides TEM images
DySi2-x Stacking faults viewed along (a) [0001] and (b) [-12-10] directions of DySi2-x
Stacking faults viewed along (a) [0001] and (b) [-12-10] directions of DySi2-x. [1]

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 


[1] G.H. Shen, J.C. Chen, L.J. Chen, Planar defects in epitaxial DySi2-x thin films on (111)Si, Applied Surface Science, 142, (1999), 332–335.

 

 

 
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