Chapter/Index: Introduction | A |
B |
C |
D |
E |
F |
G |
H |
I |
J |
K |
L |
M |
N |
O |
P |
Q |
R |
S |
T |
U |
V |
W |
X |
Y |
Z |
Appendix
Electron Diffraction of Ytterbium Silicides
| Table 979. Electron diffraction of dysprosium silicides.
| Ytterbium silicides |
Electron diffraction |
| YbSi2-x |
Diffraction pattern along the [10-10]YbSi2-x/[11-2]Si direction of a cross-sectional YbSi2-x/(111)Si sample after annealing at 300 °C for 30 min.
[1] |
Orientation relationship of (10-10)YbSi2-x/(11-2)Si from a sample after annealing at 300 °C for 30 min.
[1] |
[1] Lih J. Chen, Silicide Technology for Integrated Circuits, 2004.
|
