Practical Electron Microscopy and Database

Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix

XRD of Palladium Silicides

Table 983. XRD of palladium silicides. Palladium silicides XRD profiles   XRD spectrum of Pd/(111)Si samples annealed at 875 °C. Adapted from [1]  Pd2Si Overlapping [0001]Pd2Si/[111]Si XRD profile. The sample was annealed at 800 °C for 1 h. Adapted from [1]                        [1] J.F. Chen, L.J. Chen, Transmission electron microscopy and X-ray diffraction investigation of phase formation and transition between Pd2Si and PdSi in Pd thin films on (1ll)Si, Materials Chemistry and Physics, 39 (1995) 229-235.