EELS of Gallium (Ga)
- Practical Electron Microscopy and Database -
- An Online Book -
Electron microscopy
  Microanalysis | EM Book                                                                   http://www.globalsino.com/EM/  
 

 

Table 2402a. Main edges of Ga used in EELS analysis.

Edge(s)
Edge onsets (eV)
M3,2 103

Based on a non-relativistic theory, Allen and Rossouw [1] calculated the inelastic object functions for K-shell ionization. The calculated object functions for the K-shell excitations of some elements such as Te, Cd, As and Ga indicate that the localization of the object is less than 1 Å [2].

 

 

 


 

 

 


[1] L.J. Allen, C.J. Rossouw, Phys. Rev. B 42 (1990) 11644–11654.
[2] N.D. Browning, S.J. Pennycook, Microbeam Anal. 2 (1993) 81–89.

 

;