Defects in Materials
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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As an example, Table 2389 lists the electronic properties that are affected by structural disorders in amorphous and crystalline Si.

Table 2389. The electronic properties affected by structural disorders in amorphous and crystalline Si.

Electronic properties
Structural disorders
Bonding disorder
Electronic states in band gap
Structural defects

Electronical, metastable states

Alternative bonding configurations

Figure 2389 shows the typical sizes of various material defects and the capability of analytical techniques (See the full names of the techniques at page3928). The lowest levels of the techniques represent their spatial resolutions.

Comparison of various material defects in dimension

Figure 2389. Typical sizes of various material defects and capability of analytical techniques.

 

 

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