Optimization of Specimen Thickness for Electron Holography Analysis
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

=================================================================================

In strain analysis using electron holography, the sample thickness should satisfy the following conditions:
         i) Uniform in thickness.
         ii) In the range of 150 to 300 nm if the sample is a silicon (Si) crystal. Note that it is more convenient and accurate to work on thinner samples.

 

 

=================================================================================

The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.