Optimization of Specimen Thickness for Electron Holography Analysis
- Practical Electron Microscopy and Database -
- An Online Book -


This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.


In strain analysis using electron holography, the sample thickness should satisfy the following conditions:
         i) Uniform in thickness.
         ii) In the range of 150 to 300 nm if the sample is a silicon (Si) crystal. Note that it is more convenient and accurate to work on thinner samples.




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