Demonstrations by EM Manufacturers
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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Many experimental settings for EM demonstrations are often impractical for actual materials characterizations. For instance, for high-resolution EELS demonstrations, many results are obtained with low emission-current to reduce the energy spread. An example is that the probe current of 8.5 pA is applicable for low-loss spectroscopy, but is not sufficient to observe a core-loss spectrum.

 

 

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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.