Practical Electron Microscopy and Database

Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix

Demonstrations by EM Manufacturers

Many experimental settings for EM demonstrations are often impractical for actual materials characterizations. For instance, for high-resolution EELS demonstrations, many results are obtained with low emission-current to reduce the energy spread. An example is that the probe current of 8.5 pA is applicable for low-loss spectroscopy, but is not sufficient to observe a core-loss spectrum.