Spectrum-imaging (SI) based on EELS by STEM
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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The terms ‘electron spectroscopy imaging’ (ESI) [1] and ‘image spectroscopy’/‘imaging spectrum’ (IS) [2 - 4] have been commonly used for methods acquiring EFTEM series. In contrast, the term ‘spectrum-imaging’ (SI) [5 - 6] is used for acquiring similar three-dimensional data blocks by STEM.

Note that the use of a large convergence angle, as occurs in the STEM mode with a focused probe minimizes the problem of electron channeling in EELS measurements.

 


[1] J. Mayer, U. Eigenthaler, J.M. Plitzko, F. Dettenwanger, Micron 28 (1997) 361.
[2] P.J. Thomas, P.A. Midgley, Ultramicroscopy 88 (2001) 187.
[3] P.J. Thomas, P.A. Midgley, Ultramicroscopy 88 (2001) 179.
[4] J.-L. Lavergne, J.-M. Martin, M. Belin, Microsc. Microanal. Microstruct. 3 (1992) 517.
[5] C. Jeanguillaume, C. Colliex, Ultramicroscopy 28 (1989) 252.
[6] J.A. Hunt, D.B. Williams, Ultramicroscopy 38 (1991) 47.

 

 

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