Image Quality in EMs
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 


This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

 

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In order to obtain ideal EM images (especially TEM images), we have to compensate for the spherical aberration and the coma of the objective lens and for the image distortion of the projector system.

Note that the image rotation in EMs does not influence the quality of the EM image.

 

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The book author (Dr. Liao) welcomes your comments, suggestions, and corrections, please click here for submission. You can click How to Cite This Book to cite this book. If you let Dr. Liao know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page. This appearance can help advertise your publication.



 
 
 
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