This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

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For TEM-related measurements, including EELS, EDS, STEM, TEM, and EFTEM measurements, the TEM condition should enable sufficient contrast and intensity to be recorded on a negative, image plate or CCD camera within a reasonable acquisition time to avoid beam drift.

The interference pattern of the Ronchigram at the smooth center flashes randomly due to the small movements of the incident electron probe and specimen.

Note that the electron beam drift also limits the phase contrast transfer function in TEMs.