Temperature Rise in STEM Measurement
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers. How to Cite This Book

 

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Even if the incident-beam current density in STEM imaging is higher than that in TEM imaging, the local temperature rise on the TEM specimen due to electron irradiation in STEM imaging would not be greater from that in TEM imaging because of the small beam size.

 

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The book author (Dr. Liao) welcomes your comments, suggestions, and corrections, please click here for submission.



 
 
 
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