TEM Observation of Carbon Nanotubes
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers. How to Cite This Book

 

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No displacement damage in carbon nanotubes is caused in TEM at imaging voltages of 100 kV or lower while displacement damage can be induced at 200 kV accelerating voltage or higher.

 

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The book author (Dr. Liao) welcomes your comments, suggestions, and corrections, please click here for submission.



 
 
 
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