This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

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The M family of characteristic X-rays observed by EDS involves M_α(1), M_β(0.6), M_γ(0.05), M_ζ(0.06), and M_IIN_IV(0.01). Different from the K-family, the numbers in the parentheses present approximate relative intensities, since these intensities vary with the over-voltage and with the element in question .