Electron Inelastic Mean Free Path
of Elements and Compounds
- Practical Electron Microscopy and Database -
- An Online Book -

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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

 

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Based on Theory on Inelastic Mean Free Path (IMFP) of Electrons, the electron mean free paths are well known in two energy regimes: at high energies, where they are predicted either with Bethe(-like) equations or with the more accurate optical models based on the free-electron-gas approximation, and at very low energies, where they are calculated either with experimental data on electron lifetimes or with first-principles calculations.

Electron mean free path of some elements at different kinetic energies

Figure 4809a. Electron mean free path of some elements at different kinetic energies.

Electron Mean Free Paths

Figure 4809b. Mean free paths at different kinetic energies up to 2000 eV, for Ag, Al, NA, PMMA, Si, and SiO2.

Electron Mean Free Paths

Figure 4809c. Mean free paths at the kinetic energy range below 250 eV, for Ag, Al, GaAs, NA, PMMA, and Si.

Electron Mean Free Paths

Figure 4809d. Mean free paths at high kinetic energies for Si and SiO2.

Table 4623 lists plasmon energies, full-width-at-half-maximum of plasmon energies, plasmon mean free path, and inelastic mean free path of some common elements and compounds, as well as their crystal structure [6 -  11].

 

 

 

 

 

 

 

 

 

 

 

 

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[6] Daniels, J., Festenberg, C. V., Raether, H., and Zeppenfeld, K. (1970) Optical constants of solids by electron spectroscopy. In Springer Tracts in Modern Physics, ed. G. Hoehler, Springer, New York, NY, Vol. 54, pp. 78–135.
[7] Colliex, C., Cosslett, V. E., Leapman, R. D., and Trebbia, P. (1976) Contribution of electron energy-loss spectroscopy to the development of analytical electron microscopy. Ultramicroscopy 1, 301–315.
[8] Raether, H. (1980) Excitation of Plasmons and Interband Transitions by Electrons. Springer Tracts in Modern Physics, Springer, New York, NY, Vol. 88.
[9] Colliex, C. (1984) Electron energy-loss spectroscopy in the electron microscope. In Advances in Optical and Electron Microscopy, eds. V. E. Cosslett and R. Barer, Academic, London, Vol. 9, pp. 65–177.
[10] Ahn, C. C., ed. (2004) Transmission Electron Energy Loss Spectrometry in Materials Science and the EELS Atlas, Wiley, New York, NY.
[11] Iakoubovskii, K., Mitsuishi, K., Nakayama, Y., and Furuya, K. (2008) Thickness measurements with electron energy loss spectroscopy. Microsc. Res. Tech. 71, 626–631.
[12] B. Lesiak, A. Kosinski, A. Jablonski, L. KoÈveÂr, J. ToÂth, D. Varga, I. Cserny, M. Zagorska, I. Kulszewicz-Bajer, G. Gergely, Determination of the inelastic mean free path of electrons in polythiophenes using elastic peak electron spectroscopy method, Applied Surface Science 174 (2001) 70-85.

 

 

 

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