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Figure 2502a shows the effects of structural symmetry on XRD patterns. These effects include the difference of the reflection numbers and the peak splitting for the tetragonal and orthorhombic structures, for instance, shown in the red dotted box.

Figure 2502a. The effects of structural symmetry on XRD patterns: (a) body-centered-cubic (bcc), (b) body-centered-tetragonal (bct), and (c) body-centered-orthorhombic (bco). |

Figure 2502b. BCT (body-centered-tetragonal) structure (C11b). (a = b ≠ c and all angles = 90°) |

Figure 2502c. Schematic representation of plane stacking in the C11b structure. |

Figure 2502d. Two dimensional atomic arrangement in die stacking plane for the C54, C40 and C11b. [1]
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[1] A. Mouroux, Understanding the formation of TiSii in the presence of refractory metals
for Si technology, Acta Univ. KTH (Stockholm, Sweden, 1999).
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