Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix
Figure 2502a shows the effects of structural symmetry on XRD patterns. These effects include the difference of the reflection numbers and the peak splitting for the tetragonal and orthorhombic structures, for instance, shown in the red dotted box.
[1] A. Mouroux, Understanding the formation of TiSii in the presence of refractory metals for Si technology, Acta Univ. KTH (Stockholm, Sweden, 1999).
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