Broadening of EDS Peaks
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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The natural line width of the emitted X-rays (e.g. Mn Kα line) in EMs (electron microscopes) is only a few eV but the line widths obtained with EDS systems are normally larger than 100 eV, for instance, the EDS-detected FWHM (full width at half maximum) at the energy of Mn Kα is 135-165 eV. The natural energy distribution of the characteristic X-rays of a single line is well described by the Lorentzian probability distribution instead of Gaussian shape obtained by the energy-dispersive detectors. The electronic noise in the EDS system introduces the peak broadening that is a major source causing the difference between the EDS-detected and natural energy resolutions. The width of the electronic noise is also described as the ‘point-spread function’ of the detector.

 

 

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