Damping envelope in TEM
- Practical Electron Microscopy and Database -
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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

 

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Information limit depends on the damping envelope incorporating partial temporal coherence due to chromatic aberration, but not partial spatial coherence due to beam convergence.

Assuming the electron beam is a Gaussian-shaped source, a high-frequency damping function on TEM images can be approximately given by,

         High frequency damping function on TEM images -------------------- [4155]
where,
         Δ -- The defocus spread due to a nonmonochromatic beam and electronic instabilities,
         λ -- The wavelength of the electron beam,
         k -- Spatial frequency,
         θc -- The beam convergence angle,
         Δf -- The defocus,          
         Cs -- Spherical aberration of the objective lens.

 

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