Practical Electron Microscopy and Database

Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix

Contrast Dependence on Specimen Composition/Elements of Materials in SEM

The contrasts of SEM images can be basically categorized by topographic, material, and voltage contrast. The material contrast, also called atomic number (Z-) contrast, originate from the difference of SE or BSE yields of the chemical elements in the specimen. The spatial resolution of SE mode normally is higher than that of BSE.