Applications of TEM-related Techniques
- Practical Electron Microscopy and Database -
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The techniques related to TEM systems can be divided into two categories:
         i) Diffraction based techniques such as convergent-beam-electron-diffraction (CBED) and nanobeam electron diffraction (NBD);
         ii) Image based techniques such as high-resolution electron microscopy (HREM) and dark-field electron holography (HoloDark).

Table 4311 lists the information which an analytical transmission electron microscope (TEM), equipped with EDS and EELS systems can produce due to a variety of beam-specimen interactions.

Table 4311. Various applications of TEM-related techniques.
Applications
Examples
Others
Applications in field
Life sciences
Cellular structures, organic fibres, life environment  
Biological field
 
Medical field
 
Forensic analysis
 
Mechanical field
Plastic deformations, ordered alloy structures Phase transformations, morphological (structural) analysis
Semi-conductors
Defects from the manufacturing process, layers and structures
Nanotechnology
 
Materials sciences
Polymeric, metallic, ceramic, composite and nano-structured, nanometric, layers and structures
Metallurgy
Identify flaws, fractures and damages to micro-sized objects
Gemology
 
Applications of different techniques
Bright Field (BF)/Dark Field (DF)
To p rovide information about size and morphology of particles, and detect crystalline areas, defects, grain boundaries and phases Transmitted, elastically scattered electrons
High resolution TEM (HRTEM)
Allows lattice fringe imaging, that is directly related to the structure and visualization of defects and interfaces at atomic resolutions
Electron diffraction (structural)

To obtain crystallographic information such as lattice parameters, crystal symmetry and orientation

Analytical Electron Microscopy (AEM) (by adding accessories and techniques)
EDS (chemical)
Qualitative and semi-quantitative elemental analysis of the illuminated area with emitted X-rays  
EELS (chemical)
Qualitative and semi-quantitative elemental analysis: analyze the inelastically scattered electrons and thus reveal the information about the bonding between atoms and/or the nearest neighbors Transmitted electrons
Energy filtered TEM (EFTEM)
To use the inelastically scattered electrons to create elemental and chemical maps
Scanning TEM (STEM)
To image by enabling the formation of a small probe of convergent electron beam and scanning over a defined area in the sample Transmitted, elastically scattered electrons
High angle annular dark field (HAADF)
To obtain Z-contrast images, by selecting the high-angle incoherently scattered electrons
To image by using Auger electrons  
BSE 
To image by using backscattered electrons  
To image by using secondary electrons  
Provided information
Topographical information
   
Morphological information
   
Compositional information
   
Crystalline information
   
Scaling information
Applicable resolution
Provide information from micron sizes down to atomic scale and molecular level  
Category
Industry
Help fix problems and/or help to make a more durable, efficient product  
Education
Use TEMs for research and studies  

 

 

 

 

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