Peak Splitting in XRD Profiles
- Practical Electron Microscopy and Database -
- An Online Book -

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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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Figure 2500 shows the effects of structural symmetry on XRD patterns. These effects include the difference of the reflection numbers and the peak splitting for the tetragonal and orthorhombic structures, for instance, shown in the red dotted box.

effects of structural symmetry on XRD patterns

Figure 2500. The effects of structural symmetry on XRD patterns.

In general, both single-crystal XRD and conventional electron diffraction (ED) techniques are not sensitive enough to small crystal deformations. For such deformations, high-resolution powder XRD using synchrotron radiation can be a more sensitive and reliable technique. For instance, a distortion from cubic symmetry to tetragonal or orthorhombic (hexagonal or trigonal) symmetries should result in splitting of some peaks. Even very small distortions can often be observed with systematic peak broadening in high-resolution powder XRD patterns.

 

 

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