X-Ray Optics
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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X-ray optics is a branch of optics. X-ray optics manipulates X-rays instead of visible lights in normal light optics and electron beams in electron microscopes (EMs). The lenses for visible light are made of transparent materials that can have a refractive index significantly larger than 1 and the lenses for EMs are composed of magnetic lens , for X-rays the index of refraction is slightly smaller than unity. X-ray optics has been applied to X-ray analytical instruments for several years. Applications of X-ray optics have been reported in X-ray microscopes, X-ray telescopes, X-ray diffraction, X-ray fluorescence, tomography, lithography, wavelength dispersive spectroscopy (WDS), and -dispersive spectroscopy (EDS). The X-ray optics has been used to increase the X-ray flux incident on the specimen and to direct, focus, and collimate the emitted X-rays from a specimen (e.g. in EDS systems).

Especially, in EDS systems, focusing X-ray optics has been used on both the excitation and detection sides.

 

 

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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.